Published: April 17, 2015
Author(s)
Richard Kuhn (NIST), Raghu Kacker (NIST), Yu Lei (UTA), Jose Torres-Jimenez (CINVESTAV-Tamaulipas)
Conference
Name: Fourth International Workshop on Combinatorial Testing (IWCT 2015)
Dates: 04/13/2015 - 04/17/2015
Location: Graz, Austria
Citation: Proceedings of the 2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), pp. 1-4
This short paper introduces a method for verifying equivalence classes for module/unit testing. This is achieved using a two-layer covering array, in which some or all values of a primary covering array represent equivalence classes. A second layer covering array of the equivalence class values is computed, and its values substituted for the equivalence class names in the primary array. It is shown that this method can detect certain classes of errors without a conventional test oracle, and an illustrative example is given.
This short paper introduces a method for verifying equivalence classes for module/unit testing. This is achieved using a two-layer covering array, in which some or all values of a primary covering array represent equivalence classes. A second layer covering array of the equivalence class values is...
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This short paper introduces a method for verifying equivalence classes for module/unit testing. This is achieved using a two-layer covering array, in which some or all values of a primary covering array represent equivalence classes. A second layer covering array of the equivalence class values is computed, and its values substituted for the equivalence class names in the primary array. It is shown that this method can detect certain classes of errors without a conventional test oracle, and an illustrative example is given.
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Keywords
combinatorial testing; factor covering array; oracle problem; t-way testing; verification and validation (V&; V)
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