Computer Security Resource Center

Computer Security Resource Center

Computer Security
Resource Center

Conference Proceedings

Efficient Algorithms for T-way Test Sequence Generation

Published: October 16, 2012

Author(s)

L. Yu, Yu Lei, Raghu Kacker, Richard Kuhn, J. Lawrence

Conference

Name: 2012 17th IEEE International Conference on Engineering of Complex Computer Systems (ICECCS 2012)
Dates: July 18-20, 2012
Location: Paris, France
Citation: Proceedings of the 2012 17th IEEE International Conference on Engineering of Complex Computer Systems (ICECCS 2012), pp. 220-229

Abstract

Keywords

combinatorial testing; t-way sequence coverage; test sequence generation
Control Families

None selected

Documentation

Publication:
None available

Supplemental Material:
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