Computer Security Resource Center

Computer Security Resource Center

Computer Security
Resource Center

Conference Proceedings

Combinatorial and MC/DC Coverage Levels of Random Testing

Published: July 25, 2017

Author(s)

Sergiy Vilkomir (East Carolina University), Aparna Alluri (East Carolina University), Richard Kuhn (NIST), Raghu Kacker (NIST)

Conference

Name: 2017 IEEE International Conference on Software Quality Reliability and Security (QRS-C 2017)
Dates: July 25-29, 2017
Location: Prague, Czech Republic
Citation: Proceedings. 2017 IEEE International Conference on Software Quality, Reliability and Security (Companion Volume) (QRS-C 2017), pp. 61-68

Abstract

Keywords

combinatorial testing; MC/DC; pairwise; random testing; coverage
Control Families

None selected

Documentation

Publication:
Conference Proceedings (DOI)

Supplemental Material:
Preprint (pdf)

Topics

Security and Privacy
testing & validation

Technologies
software