Computer Security Resource Center

Computer Security Resource Center

Computer Security
Resource Center

Conference Proceedings

RTL-PSC: Automated Power Side-Channel Leakage Assessment at Register-Transfer Level

Published: April 23, 2019

Author(s)

Miao He (University of Florida), Jungmin Park (University of Florida), Adib Nahiyan (University of Florida), Apostol Vassilev (NIST), Yier Jin (University of Florida), Mark Tehranipoor (University of Florida)

Conference

Name: IEEE VLSI Test Symposium 2019
Dates: April 23-25, 2019
Location: Monterey, CA
Citation: 2019 IEEE 37th VLSI Test Symposium (VTS), vol. 1, pp. 1-6

Abstract

Keywords

leakage assessment; Register-Transfer Level; side-channel attacks; vulnerability evaluation
Control Families

None selected

Documentation

Publication:
Conference Proceedings (DOI)

Supplemental Material:
Preprint (other)

Topics

Security and Privacy
cryptography; threats; vulnerability management