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Semiconductor Traceability and Provenance Workshop

Semiconductor Traceability and Provenance Workshop

The National Institute of Standards and Technology (NIST) will host the Semiconductor Traceability and Provenance Workshop on Tuesday, January 27, 2026, at the NIST National Cybersecurity Center of Excellence (NCCoE) conference facility, in Rockville, Maryland. This in-person, one-day event builds on the momentum from the April 2025 workshop on Trust and Provenance in the Semiconductor Supply Chain, which identified traceability as the top priority of semiconductor industry stakeholders.  

As semiconductor devices grow more complex and globally distributed, the risks from counterfeit components, malicious tampering, and opaque sourcing threaten the security, reliability, and resilience of critical systems. Strengthening traceability and provenance is essential to mitigating supply chain threats, supporting national security imperatives, and addressing the grand challenges in secure microelectronics (https://nvlpubs.nist.gov/nistpubs/CHIPS/NIST.CHIPS.1000.pdf).

The workshop will convene technical leaders across the semiconductor ecosystem (e.g., hyperscalers, auto and semiconductor companies, federal agencies, academia) to address the practical challenges and opportunities for implementing traceability in semiconductor chips. This one-day event will feature plenary, panel, and interactive breakout sessions. Participants will be encouraged to collaborate and discuss key questions and topics that will identify short-term (<1 year) and longer-term (2028-2029 time frame) activities related to semiconductor traceability and provenance. The topics that will be considered include but are not limited to:

    • Existing solutions
    • Technical, operational challenges to traceability adoption
    • Opportunities for public-private collaboration (e.g., hyperscalers, automobile,
      semiconductor companies, government agencies, academia)
    • Roadblocks to alignment and paths to overcoming them
    • Economic drivers and pilot use cases for traceability
    • Frameworks for joint standards development and implementation
    • Roadmap for collaboration and path to success

Key findings/decisions will be published in a post-workshop report.

Selected Presentations
January 27, 2026 Type
8:30 AM Welcome and Workshop Briefing
James St. Pierre - NIST
Opening Remarks
8:40 AM Overview of the Meeting Objectives and Desired Outcomes
Kostas Amberiadis - NIST
Sanjay Rekhi - NIST
Briefing
8:50 AM Chip Traceability Viewpoint -- Hyperscalers & Personal Computing
Jeff Andersen - Google
Eric Eilertson - Microsoft
Effendi Leobandung - IBM
Apoorav Trehan - Microsoft
Joshua Schiffman - HP Inc.
Presentation
10:20 AM Chip Traceability Viewpoint -- Auto
Robert Kaster - Bosch
Craig Rawlings - Stellantis
Andreas Aal - VW
Presentation
11:20 AM SEMI Phase 0 Traceability Project
Melissa Grupen-Shemansky - SEMI
Presentation
11:45 AM Chip Traceability
Jim Will - USPAE
Presentation
1:00 PM Chip Traceability Viewpoint -- Government
Pauline Paki - DHS
Paul A. Lyons - DOW
Presentation
1:40 PM Panel Discussion: Traceability Opportunities, Roadblocks
Alex Tzonkov - AMD
Shawn Fetterolf - Intel
Tamara Schmitz - Micron
Daniel O'Laughlin - Qualcomm
Lee Harrison - Siemens EDA
Reed Hinkel - Synopsys
Scott Best - Rambus (Panel Moderator)
Panel
4:00 PM Summarize Breakout Sessions
Kostas Amberiadis - NIST
Michael Pease - NIST
Matthew Areno - Rickert-Areno Eng, LLC
Presentation

Event Details

Starts: January 27, 2026 - 08:30 AM EST
Ends: January 27, 2026 - 05:00 PM EST

Format: In-person Type: Workshop

Agenda

Attendance Type: Open to public
Audience Type: Industry, Government, Academia


Location

National Cybersecurity Center of Excellence (NCCoE) 
9700 Great Seneca Highway
Rockville, MD 20850

Related Topics

Security and Privacy: cybersecurity supply chain risk management, security measurement

Technologies: semiconductors

Created November 25, 2025, Updated February 20, 2026