Computer Security Resource Center

Computer Security Resource Center

Computer Security
Resource Center

Conference Proceedings

Estimating t-Way Fault Profile Evolution During Testing

Published: September 07, 2016

Author(s)

Richard Kuhn (NIST), Raghu Kacker (NIST), Yu Lei (UTSA)

Conference

Name: 2016 IEEE 40th Annual Computer Software and Applications Conference (COMPSAC)
Dates: June 10-14, 2016
Location: Atlanta, Georgia, United States
Citation: Proceedings of the 2016 IEEE 40th Annual Computer Software and Applications Conference Workshops (COMPSACW 2016), pp. 596-597

Abstract

Keywords

testing; combinatorial testing; software fault
Control Families

None selected

Documentation

Publication:
Conference Proceedings (DOI)

Supplemental Material:
Preprint (pdf)

Topics

Security and Privacy
general security & privacy