Computer Security Resource Center

Computer Security Resource Center

Computer Security
Resource Center

Conference Proceedings

A Method-Level Test Generation Framework for Debugging Big Data Applications

Published: December 10, 2018

Author(s)

Huadong Feng (UTA), Jaganmohan Chandrasekaran (UTA), Yu Lei (UTA), Raghu Kacker (NIST), Richard Kuhn (NIST)

Conference

Name: 2018 IEEE International Conference on Big Data (Big Data)
Dates: December 10-13, 2018
Location: Seattle, Washington, United States
Citation: Proceedings. 2018 IEEE International Conference on Big Data, pp. 221-230

Abstract

Keywords

testing; unit testing; big data application testing; test generation; test reduction; debugging; mutation testing
Control Families

None selected

Documentation

Publication:
Conference Proceedings (DOI)

Supplemental Material:
Preprint (pdf)

Topics

Security and Privacy
testing & validation

Technologies
big data