Internet of Things (IoT) Metrology

Voas, Jeffrey; Kuhn, Richard; Laplante, Phillip

doi:https://doi.org/10.1109/MITP.2018.032501740

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Journal Article

Internet of Things (IoT) Metrology

Documentation Topics

Published: June 11, 2018
Citation: IT Professional vol. 20, no. 3, (May/June 2018) pp. 6-10

Author(s)

Jeffrey Voas (NIST), Richard Kuhn (NIST), Phillip Laplante (Penn State University)

Abstract

In the Internet of Things (IoT), what can we measure? The authors explore how the field of metrology might be applicable to the IoT.

Keywords

cyber physical systems; internet of things; metrics; metrology

Control Families

None selected

Documentation

Publication:
https://doi.org/10.1109/MITP.2018.032501740

Supplemental Material:
Preprint (pdf)

Document History:
06/11/18: Journal Article (Final)

Topics

Security and Privacy

security measurement

Applications

Internet of Things