Computer Security Resource Center

Computer Security Resource Center

Computer Security
Resource Center

Journal Article

Measuring and Specifying Combinatorial Coverage of Test Input Configurations

Published: December 01, 2016
Citation: Innovations in Systems and Software Engineering vol. 12, no. 4, (December 2016) pp. 249-261

Author(s)

Richard Kuhn (NIST), Raghu Kacker (NIST), Yu Lei (UTA)

Abstract

Keywords

combinatorial testing; configuration model; covering array; fault coverage; state-space coverage; t-way testing; verification and validation (V& V)
Control Families

None selected

Documentation

Publication:
Journal Article (DOI)

Supplemental Material:
Preprint (pdf)

Related NIST Publications:
SP 800-142

Topics

Security and Privacy
testing & validation