Combinatorial Methods for Trust and Assurance

Embedded System Faults and Vulnerabilities

Papers

Weiss, A., Gautham, S., Jayakumar, A. V., Elks, C. R., Kuhn, D. R., Kacker, R. N., & Preusser, T. B. (2021). Understanding and fixing complex faults in embedded cyberphysical systems. Computer, 54(1), 49-60.

Jayakumar, A. V., Gautham, S., Kuhn, R., Simons, B., Collins, A., Dirsch, T., ... & Elks, C. (2020, October). Systematic software testing of critical embedded digital devices in nuclear power applications. In 2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) (pp. 85-90). IEEE.

Elks, C., Jayakumar, A., Collins, A., Hite, R., Karles, T., Deloglos, C., ... & Gautham, S. (2019). Preliminary results of a bounded exhaustive testing study for software in embedded digital devices in nuclear power applications. Idaho National Laboratory US Department of Energy Office of Nuclear Energy report INL/EXT-19-55606.

Jayakumar, A., Kuhn, D. R., Simons, B., Collins, A., Gautham, S., Hite, R., ... & Elks, C. (2021). A Pseudo Exhaustive Software Testing Framework for Embedded Digital Devices in Nuclear Power. National Institute of Standards and Technology, Gaithersburg.